Due to rapidly escalating spread of the coronavirus disease (COVID-19), the workshop has been POSTPONED

Only by invitation

CL spectroscopy and EBIC imaging in scanning and transmission electron microscopes are well-adapted techniques to investigate both the optical and electrical properties of semiconductor nanostructures with an adequate spatial resolution. In recent years, the focus of this field has shifted from planar quantum well structures to three-dimensional nanostructures. In this context, the correlation of cathodoluminescence results with a variety of other electron microscopy techniques, among them energy-dispersive x-ray spectroscopy as well as electron backscatter diffraction, has resulted in new insights in the chemical or microstructural characteristics of these nanostructures.

Deadline for abstract submission : Feb. 1, 2020